LabAdviser/314/Microscopy 314-307/TEM/T20/STEM
Scanning TEM: <br\> By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomic number (z-contrast image).
Scanning TEM: <br\> By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomic number (z-contrast image).