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Techniques applied
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Sample types/Materials
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Description of application/Abstract
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| Title |
Type |
Author |
WOS link |
XPS |
UPS |
ISS |
REELS |
Raman |
Additional options/hardware |
|
|
| Multitechnique Surface Characterization of Organic LED Material |
Application note |
P Mack |
|
X |
X |
|
X |
|
|
Organic LED's |
Abstract
|
| Advantages of coincident XPS-Raman in the analysis of mineral oxides species |
Application note |
|
|
X |
|
|
|
X |
|
TiO2, CaCO3 |
|
| Spectroscopic analysis of solid oxide fuel cell material with XPS |
Application note |
P Mack |
|
X |
|
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|
|
|
|
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| Rapid XPS image acquisition using SnapMap |
Application note |
R Simpson |
|
X |
|
|
|
|
SnapMap |
|
|
| Composition, coverage and band gap analysis of ALD-grown ultra thin films |
Application note |
P Mack |
|
X |
|
X |
X |
|
Band gap |
Gate dielectrics, HfO2, SiO2 |
|
| Confirming the layer structure of an organic FET device |
Application note |
P Mack |
|
X |
|
|
|
|
MAGCIS |
Organic FET's, |
|
| Surface analysis of zeolites: An XPS, variable kinetic energy XPS, and low energy ion scattering study |
Publication |
SR Bare |
link |
X |
|
X |
|
|
|
Zeolites, Metal oxides |
Abstract
|
| Surface composition analysis by low-energy ion scattering |
Publication, background |
H H Brongersma |
link |
|
|
X |
|
|
|
|
Abstract
|
| Monitoring surface metal oxide catalytic active sites with Raman spectroscopy |
Publication, review |
I E Wachs |
link |
|
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|
|
X |
|
Metal oxides |
Abstract
|
| Diffusion of In0.53Ga0.47As elements through hafnium oxide during post deposition annealing |
Publication |
W Cabrera |
link |
X |
|
X |
|
|
TEM |
HfO2, InGaAs, ALD |
Abstract
|
| Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications |
Publication, review |
C V Cushman |
link |
|
|
X |
|
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Abstract
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| HfO2 on MoS2 by Atomic Layer Deposition: Adsorption Mechanisms and Thickness Scalability |
Publication |
S McDonnell |
link |
X |
|
X |
|
|
AFM, ALD |
HfO2, MoS2 |
Abstract
|
| Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS |
Publication |
S Prusa |
link |
|
|
X |
|
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|
graphene |
Abstract
|
| Reflection electron energy loss spectroscopy for ultrathin gate oxide materials |
Publication |
H C Shin |
[1] |
X |
|
|
X |
|
Valence band |
HfZrO4, |
Abstract
|
| Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions |
Publication |
R Steinberger |
link |
X |
|
X |
|
|
AES, ARXPS, sputter profiles |
Abstract
|
| Electrochemical Characterization and Quantified Surface Termination Obtained by Low Energy Ion Scattering and X-ray Photoelectron Spectroscopy of Orthorhombic and Rhombohedral LaMnO3 Powders |
Publication |
E Symianakis |
|
X |
|
X |
|
|
XRD |
Catalysts, LaMnO3 |
Abstract
|
| The Thermal Oxidation of TiAlN High Power Pulsed Magnetron Sputtering Hard Coatings as Revealed by Combined Ion and Electron Spectroscopy |
Publication |
M Wiesing |
link |
X |
X |
X |
|
|
Ar sputtering |
TiAlN |
Abstract
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| Electronic structure and energy band gap of poly(9,9-dioctylfluorene) investigated by photoelectron spectroscopy |
Publication |
L S Liao |
link |
X |
X |
|
|
|
|
Polymer |
Abstract
|
| Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS |
Publication |
Y R Denny |
link |
X |
|
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X |
|
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Abstract
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