Jump to content
Main menu
Main menu
move to sidebar
hide
General
Home
Safety
LabManager
Training Videos
Characterization (B314/307)
Layout and Phones (B314/307)
Safety
Preparation
Microscopy
Fabrication & Characterization (B346/347)
Layout and Phones (B346/347)
Getting Started
Process Flow
Tool Package Training (TPT)
Process Information
Back-end Processing
Bonding
Characterization
Doping
Etching
Lithography
Pattern Design
Polymer Processing
Thermal Processing
Thin Film Deposition
Wafer Cleaning
Wafer Drying
Additional Information
Wafer Information
Cleanroom Chemicals
Fume Hoods
Contact
Administration
Contact Information
LabAdviser Mailbox
Fabrication Support
Microscopy Support
Editor Pages
Recent changes
Sidebar Access
Editor Rules (LabIntra)
Help
Search
Search
Appearance
Log in
Personal tools
Log in
Contents
move to sidebar
hide
Beginning
1
QC
Toggle QC subsection
1.1
Quality Control (QC) for the KOH Si etching baths.
2
Mixing KOH
3
Theory
Toggle the table of contents
Specific Process Knowledge/Etch/KOH Etch/ProcessInfo
Page
Discussion
English
Read
View source
View history
Tools
Tools
move to sidebar
hide
Actions
Read
View source
View history
General
What links here
Related changes
Special pages
Printable version
Permanent link
Page information
Appearance
move to sidebar
hide
From LabAdviser
<
Specific Process Knowledge
|
Etch
|
KOH Etch
Revision as of 15:25, 13 March 2018 by
Kabi
(
talk
|
contribs
)
(
→
Theori
)
(
diff
)
← Older revision
|
Latest revision
(
diff
) |
Newer revision →
(
diff
)
QC
Quality Control (QC) for the KOH Si etching baths.
Quality Control (QC) for Si Etch 01, and Si Etch 02
The QC procedure for Si Etch: 01
The QC procedure for Si Etch: 01
The newest QC data for KOH2
The newest QC data for KOH3
QC Recipe:
Solution
28 wt% KOH
Temperature
80°C
Time
90 min
Substrate
Si (100)
Masking
No masking
QC limits
Si Etch 01
Si Etch 02
Etch rate in Si(100)
1.3 ± 0.1 µm/min
1.29 ± 0.06 µm/min
Roughness
not measured
not measured
Nonuniformity
< 3%
< 3%
Mixing KOH
Theory