Specific Process Knowledge/Characterization/Sample imaging

The list of instruments for sample imaging available at Danchip includes 6 optical microscopes , three scanning electron microscopes (SEM's) and an atomic force microscope (AFM). These instruments cover a wide range of applications: Below is listed some characteristics.

	Optical microscopes	SEM	AFM
Magnification range	25x to 1000x	100x to 500.000x	Maximum scanned area 90x90 µm
Depth of focus	Low	Very high