Specific Process Knowledge/Etch/Etching of Bulk Glass: Difference between revisions
Appearance
| Line 264: | Line 264: | ||
| | | | ||
*40% pre-mixed HF | *40% pre-mixed HF | ||
|-valign="top" | |-valign="top" | ||
|'''Possible masking materials''' | |'''Possible masking materials''' | ||
| Line 272: | Line 271: | ||
*[[Specific Process Knowledge/Thin film deposition/Deposition of Silicon|Sputtered silicon (Alcatel)]] (bad adhesion and step coverage) | *[[Specific Process Knowledge/Thin film deposition/Deposition of Silicon|Sputtered silicon (Alcatel)]] (bad adhesion and step coverage) | ||
*We are testing other masks at the moment (ask BGE) | *We are testing other masks at the moment (ask BGE) | ||
|- valign="top" | |- valign="top" | ||
|'''Etch rate''' | |'''Etch rate''' | ||
| Line 280: | Line 278: | ||
| | | | ||
*~3.9 µm/min | *~3.9 µm/min | ||
|-valign="top" | |-valign="top" | ||
|'''Uniformity''' | |'''Uniformity''' | ||
| Line 287: | Line 284: | ||
| | | | ||
* | * | ||
|-valign="top" | |-valign="top" | ||
| Line 295: | Line 291: | ||
| | | | ||
*1 wafer at a time | *1 wafer at a time | ||
|-valign="top" | |-valign="top" | ||
|'''Size of substrate''' | |'''Size of substrate''' | ||
| Line 302: | Line 297: | ||
| | | | ||
*4" wafers | *4" wafers | ||
|-valign="top" | |-valign="top" | ||
|'''Allowed materials''' | |'''Allowed materials''' | ||
| Line 309: | Line 303: | ||
| | | | ||
*No restrictions | *No restrictions | ||
|- | |- | ||
|} | |} | ||