Specific Process Knowledge/Characterization/KLA-Tencor Surfscan 6420: Difference between revisions
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!style="background:silver; color:black" align="center" valign="center" rowspan=" | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Process parameter range | ||
|style="background:LightGrey; color:black"|Process Temperature | |style="background:LightGrey; color:black"|Process Temperature | ||
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*1 atm | *1 atm | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates |
Revision as of 10:11, 23 April 2013
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KLA-Tencor Surfscan 6420
Particles counting of a unpatterned surface. A broad range of particles size from 0.1 µm to greater than 3 µm can be measured on a polished silicon or epitaxial layers. Thin films as e.g. Poly-si, Nitride and thermal Oxide can also be inspected. The system will remove small surface roughness so it not count as a particle.
The user manual(s), quality control procedure(s) and results, user APV(s), technical information and contact information can be found in LabManager:
Purpose | ||
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Performance | ||
Process parameter range | Process Temperature |
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Process pressure |
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Substrates | Batch size |
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Substrate material allowed |
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