Specific Process Knowledge/Etch/Etching of Silicon Oxide: Difference between revisions
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=This Part is under construction= | |||
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Etch/Etching_of_Silicon_Nitride click here]''' | |||
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== Comparing silicon etch methodes at Danchip [[Image:section under construction.jpg|70px]]== | |||
There are a broad varity of silicon nitride etch methods at Danchip. The methodes are compared here to make it easier for you to compare and choose the one that suits your needs. | |||
*[[Specific Process Knowledge/Etch/Wet Silicon Nitride Etch|Wet Silicon Nitride Etch]] | |||
*[[/Etch of Silicon Nitride using RIE|Etch of Silicon Nitride using RIE]] | |||
*[[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)/Silicon Nitride Etch using AOE|Etch of Silicon Nitride using AOE]] | |||
*[[Specific Process Knowledge/Etch/IBE/IBSD Ionfab 300|IBE/Ion Beam Etching using IBSD Ionfab 300]] | |||
==Compare the methodes for Silicon Nitride etching== | |||
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! | |||
![[Specific Process Knowledge/Etch/Wet Silicon Nitride Etch|Wet Silicon Nitride Etch]] | |||
![[Specific Process Knowledge/Etch/Wet Silicon Oxide Etch (BHF)|BHF]] | |||
![[Specific Process Knowledge/Etch/RIE (Reactive Ion Etch)|RIE (Reactive Ion Etch)]] | |||
![[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)|AOE (Advanced Oxide Etch)]] | |||
![[Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch)|ASE (Advanced Silicon Etch)]] | |||
![[Specific Process Knowledge/Etch/ICP Metal Etcher|ICP Metal Etch]] | |||
![[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | |||
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!Generel description | |||
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*Isotropic etch | |||
*Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si<sub>3</sub>N<sub>4</sub>/Si (>100) and Si<sub>3</sub>N<sub>4</sub>/SiO<sub>2</sub> (>20) @ 180 C. | |||
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*Isotropic etch | |||
*Well suited for removing all PECVD nitride on a wafer surface (nitride strip) without a mask. Etches LPCVD nitride very slowly | |||
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*Anisotropic etch: vertical sidewalls | |||
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*AOE | |||
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*ASE | |||
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*This is dedicated to metal etch. | |||
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*Primarily for pure physical etch by sputtering with Ar-ions | |||
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!Possible masking materials | |||
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*Silicon Oxide | |||
*PolySilicon | |||
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*Photoresist | |||
*PolySilicon | |||
*Blue film | |||
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*Photoresist | |||
*E-beam resist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium | |||
*Metals if they cover less than 5% of the wafer area (ONLY RIE2!) | |||
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AOE | |||
*Photoresist and zep resist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium oxide | |||
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ASE | |||
*Photoresist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium | |||
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ICP Metal | |||
*Photo-, DUV- and e-beamresist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium | |||
*Cr | |||
*Ti | |||
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*Any material that is accepted in the machine | |||
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!Etch rate range | |||
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*Si<sub>3</sub>N<sub>4</sub> @ 180 <sup>o</sup>C: ~84 Å/min | |||
*Si<sub>3</sub>N<sub>4</sub> @ 160 <sup>o</sup>C: ~60 Å/min | |||
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*PECVD nitride: ~400-1000 Å/min | |||
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*Typically 40-50 nm/min can be increased or decreased by using other recipe parameters. | |||
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AOE | |||
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ASE | |||
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ICP metal | |||
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*Process dependant. Has not been tested yet. | |||
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!Substrate size | |||
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*<nowiki>#</nowiki>1-25 100 mm wafers | |||
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*<nowiki>#</nowiki>1-25 100mm wafers in our 100mm bath | |||
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*As many small samples as can be fitted on the 100mm carrier. | |||
*<nowiki>#</nowiki>1 100mm wafer (or smaller with carrier) | |||
*<nowiki>#</nowiki>1 150mm wafer (only when the system is set up for 150mm) | |||
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*As many small samples as can be fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 100 mm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | |||
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*As many small samples as can be fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 100 mm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | |||
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*As many small samples as can be fitted on a 150mm wafer | |||
*<nowiki>#</nowiki>5 50 mm wafer fitted on a 150mm wafer | |||
*<nowiki>#</nowiki>1 100 mm wafer on a 150mm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers (The system is normally set up to 150mm) | |||
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*As many samples as can be securely fitted on a up to 200mm wafer | |||
*<nowiki>#</nowiki>1 50 mm wafer with special carrier | |||
*<nowiki>#</nowiki>1 100 mm wafer with special carrier | |||
*<nowiki>#</nowiki>1 150 mm wafers with special carrier | |||
*<nowiki>#</nowiki>1 200 mm wafer | |||
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!'''Allowed materials''' | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*Blue film | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*E-beam resist | |||
*Other metals if they cover less than 5% of the wafer area (ONLY RIE2!) | |||
*Quartz/fused silica | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*zep resist | |||
*Aluminium | |||
*Chromium (try to avoid it) | |||
*Quartz/fused silica | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*E-beam resist | |||
*Aluminium | |||
*Quartz/fused silica | |||
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*Silicon | |||
*Photoresist/e-beam resist | |||
*PolySilicon | |||
*Silicon oxide | |||
*Silicon (oxy)nitride | |||
*Aluminium | |||
*Titanium | |||
*Chromium | |||
*Quartz/fused silica | |||
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*Silicon | |||
*Silicon oxides | |||
*Silicon (oxy)nitrides | |||
*Metals from the +list | |||
*Metals from the -list | |||
*Alloys from the above list | |||
*Stainless steel | |||
*Glass | |||
*III-V materials | |||
*Resists | |||
*Polymers | |||
*Capton tape | |||
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