Specific Process Knowledge/Etch/Etching of Silicon Oxide: Difference between revisions
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=This Part is under construction= | |||
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Etch/Etching_of_Silicon_Nitride click here]''' | |||
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== Comparing silicon etch methodes at Danchip [[Image:section under construction.jpg|70px]]== | |||
There are a broad varity of silicon nitride etch methods at Danchip. The methodes are compared here to make it easier for you to compare and choose the one that suits your needs. | |||
*[[Specific Process Knowledge/Etch/Wet Silicon Nitride Etch|Wet Silicon Nitride Etch]] | |||
*[[/Etch of Silicon Nitride using RIE|Etch of Silicon Nitride using RIE]] | |||
*[[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)/Silicon Nitride Etch using AOE|Etch of Silicon Nitride using AOE]] | |||
*[[Specific Process Knowledge/Etch/IBE/IBSD Ionfab 300|IBE/Ion Beam Etching using IBSD Ionfab 300]] | |||
==Compare the methodes for Silicon Nitride etching== | |||
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![[Specific Process Knowledge/Etch/Wet Silicon Nitride Etch|Wet Silicon Nitride Etch]] | |||
![[Specific Process Knowledge/Etch/Wet Silicon Oxide Etch (BHF)|BHF]] | |||
![[Specific Process Knowledge/Etch/RIE (Reactive Ion Etch)|RIE (Reactive Ion Etch)]] | |||
![[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)|AOE (Advanced Oxide Etch)]] | |||
![[Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch)|ASE (Advanced Silicon Etch)]] | |||
![[Specific Process Knowledge/Etch/ICP Metal Etcher|ICP Metal Etch]] | |||
![[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | |||
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!Generel description | |||
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*Isotropic etch | |||
*Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si<sub>3</sub>N<sub>4</sub>/Si (>100) and Si<sub>3</sub>N<sub>4</sub>/SiO<sub>2</sub> (>20) @ 180 C. | |||
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*Isotropic etch | |||
*Well suited for removing all PECVD nitride on a wafer surface (nitride strip) without a mask. Etches LPCVD nitride very slowly | |||
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*Anisotropic etch: vertical sidewalls | |||
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*AOE | |||
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*ASE | |||
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*This is dedicated to metal etch. | |||
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*Primarily for pure physical etch by sputtering with Ar-ions | |||
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!Possible masking materials | |||
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*Silicon Oxide | |||
*PolySilicon | |||
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*Photoresist | |||
*PolySilicon | |||
*Blue film | |||
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*Photoresist | |||
*E-beam resist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium | |||
*Metals if they cover less than 5% of the wafer area (ONLY RIE2!) | |||
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AOE | |||
*Photoresist and zep resist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium oxide | |||
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ASE | |||
*Photoresist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium | |||
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ICP Metal | |||
*Photo-, DUV- and e-beamresist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium | |||
*Cr | |||
*Ti | |||
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*Any material that is accepted in the machine | |||
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!Etch rate range | |||
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*Si<sub>3</sub>N<sub>4</sub> @ 180 <sup>o</sup>C: ~84 Å/min | |||
*Si<sub>3</sub>N<sub>4</sub> @ 160 <sup>o</sup>C: ~60 Å/min | |||
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*PECVD nitride: ~400-1000 Å/min | |||
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*Typically 40-50 nm/min can be increased or decreased by using other recipe parameters. | |||
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AOE | |||
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ASE | |||
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ICP metal | |||
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*Process dependant. Has not been tested yet. | |||
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!Substrate size | |||
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*<nowiki>#</nowiki>1-25 100 mm wafers | |||
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*<nowiki>#</nowiki>1-25 100mm wafers in our 100mm bath | |||
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*As many small samples as can be fitted on the 100mm carrier. | |||
*<nowiki>#</nowiki>1 100mm wafer (or smaller with carrier) | |||
*<nowiki>#</nowiki>1 150mm wafer (only when the system is set up for 150mm) | |||
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*As many small samples as can be fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 100 mm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | |||
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*As many small samples as can be fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 100 mm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | |||
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*As many small samples as can be fitted on a 150mm wafer | |||
*<nowiki>#</nowiki>5 50 mm wafer fitted on a 150mm wafer | |||
*<nowiki>#</nowiki>1 100 mm wafer on a 150mm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers (The system is normally set up to 150mm) | |||
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*As many samples as can be securely fitted on a up to 200mm wafer | |||
*<nowiki>#</nowiki>1 50 mm wafer with special carrier | |||
*<nowiki>#</nowiki>1 100 mm wafer with special carrier | |||
*<nowiki>#</nowiki>1 150 mm wafers with special carrier | |||
*<nowiki>#</nowiki>1 200 mm wafer | |||
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!'''Allowed materials''' | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*Blue film | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*E-beam resist | |||
*Other metals if they cover less than 5% of the wafer area (ONLY RIE2!) | |||
*Quartz/fused silica | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*zep resist | |||
*Aluminium | |||
*Chromium (try to avoid it) | |||
*Quartz/fused silica | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*E-beam resist | |||
*Aluminium | |||
*Quartz/fused silica | |||
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*Silicon | |||
*Photoresist/e-beam resist | |||
*PolySilicon | |||
*Silicon oxide | |||
*Silicon (oxy)nitride | |||
*Aluminium | |||
*Titanium | |||
*Chromium | |||
*Quartz/fused silica | |||
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*Silicon | |||
*Silicon oxides | |||
*Silicon (oxy)nitrides | |||
*Metals from the +list | |||
*Metals from the -list | |||
*Alloys from the above list | |||
*Stainless steel | |||
*Glass | |||
*III-V materials | |||
*Resists | |||
*Polymers | |||
*Capton tape | |||
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Revision as of 11:21, 10 April 2013
Silicon oxide can be etched using either wet chemistry or dry etch equipment. Wet chemistry is mainly used to remove all the oxide on the surface (backside and front side) of a wafer or for isotrotropic etching. Dry etching etches anisotropic. It etches one side of the wafer at a time and can be used to etch structures with several masking materials.
Etch of silicon oxide can be done by either wet etch or dry etch. The standard setups for this here at DANCHIP are:
Wet etches:
Dry etches:
Comparison of wet Silicon Oxide etch and dry etches (RIE and AOE) etch for etching of Silicon Oxide
Wet Silicon Oxide etch (BHF, SIO Etch (wetting agent), 5%HF) | RIE | AOE | |
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General description |
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Possible masking materials |
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Etch rate |
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Batch size |
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Size of substrate |
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Allowed materials |
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This Part is under construction
Feedback to this page: click here
Comparing silicon etch methodes at Danchip
There are a broad varity of silicon nitride etch methods at Danchip. The methodes are compared here to make it easier for you to compare and choose the one that suits your needs.
- Wet Silicon Nitride Etch
- Etch of Silicon Nitride using RIE
- Etch of Silicon Nitride using AOE
- IBE/Ion Beam Etching using IBSD Ionfab 300
Compare the methodes for Silicon Nitride etching
Wet Silicon Nitride Etch | BHF | RIE (Reactive Ion Etch) | AOE (Advanced Oxide Etch) | ASE (Advanced Silicon Etch) | ICP Metal Etch | IBE/IBSD Ionfab 300 | |
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Generel description |
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Possible masking materials |
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AOE
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ASE
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ICP Metal
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Etch rate range |
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AOE |
ASE |
ICP metal |
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Substrate size |
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Allowed materials |
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