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Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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Revision as of 13:51, 4 February 2013
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Pvl
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Comparison of optical microscope, optical profiler, SEM, AFM and stylus profiler for sample imaging
← Older edit
Revision as of 13:51, 4 February 2013
view source
Pvl
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talk
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contribs
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Bureaucrats
, danchip,
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Comparison of optical microscope, optical profiler, SEM, AFM and stylus profiler for sample imaging
Newer edit →
Line 62:
Line 62:
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|1-20 nm
|1-20 nm
:
depends on what SEM you use
depends on what SEM you use
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