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Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

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==Comparison of optical microscopes, optical profiler, SEM and AFM for sample imaging==
==Comparison of optical microscope, optical profiler, SEM, AFM and stylus profiler for sample imaging==


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![[Specific Process Knowledge/Thin film deposition/Furnace LPCVD Nitride|Optical microscopes]]
![[Specific_Process_Knowledge/Characterization/Optical_microscope|Optical microscopes]]
![[Specific Process Knowledge/Thin film deposition/PECVD|Optical profiler]]
![[Specific_Process_Knowledge/Characterization/Profiler#Optical_Profiler_.28Sensofar.29|Optical profiler]]
![[Specific Process Knowledge/Thin film deposition/PECVD|SEM]]
![[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy|SEM]]
![[Specific Process Knowledge/Thin film deposition/PECVD|AFM]]
![[Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy|AFM]]
![[Specific Process Knowledge/Thin film deposition/PECVD|Stylus profiler (Detkak)]]
![[Specific_Process_Knowledge/Characterization/Profiler#Dektak_XTA_new_stylus_profiler|Stylus profiler (Detkak)]]
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