Specific Process Knowledge/Characterization/Topographic measurement: Difference between revisions
Appearance
No edit summary |
No edit summary |
||
| Line 34: | Line 34: | ||
|Resolution xy | |Resolution xy | ||
|up to 5900 data points per profile | |up to 5900 data points per profile | ||
| | |down to 0.067 µm | ||
| | | | ||
|- | |- | ||
|Resolution z | |Resolution z | ||
|1 or 25Å | |1 or 25Å | ||
| | |1Å to 20Å | ||
| | | | ||
|- | |- | ||