Specific Process Knowledge/Etch/ICP Metal Etcher/silicon/nano/Sinano35: Difference between revisions
Created page with "== The Sinano3.5 recipe == {| border="2" cellpadding="2" cellspacing="1" |+ '''Recipe Sinano3.5''' |- ! rowspan="6" align="center"| Recipe | Gas | BCl<sub>3</sub> 5 sccm, HB..." |
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| 180 nm zep etched down to 43 nm | | The [[Specific Process Knowledge/Etch/ICP Metal Etcher/silicon/nano/nanoetch/180nmzep|180 nm zep resist]] etched down to 43 nm | ||
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Revision as of 15:22, 11 December 2012
The Sinano3.5 recipe
Recipe | Gas | BCl3 5 sccm, HBR 15 sccm |
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Pressure | 5 mTorr, Strike 3 secs @ 5 mTorr | |
Power | 900 W CP, 60 W PP | |
Temperature | 20 degs | |
Hardware | 100 mm Spacers | |
Time | 120 secs | |
Conditions | Run ID | 438, 440, ID |
Conditioning | Sequence: Oxygen clean, MU tests, processes, no oxygen between runs | |
Mask | The 180 nm zep resist etched down to 43 nm |
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The 30 nm trenches
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The 60 nm trenches
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The 90 nm trenches
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The 120 nm trenches
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The 150 nm trenches
Nominal trench line width | ' | ' | 30 | 60 | 90 | 120 | 150 | Average | Std. dev. |
Etch rate | nm/min | 90 | 109 | 112 | 114 | 117 | 108 | 11 | |
Sidewall angle | degs | 83 | 81 | 82 | 81 | 80 | 81 | 1 | |
CD loss | nm/edge | 27 | 47 | 62 | 80 | 97 | 63 | 27 | |
CD loss foot | nm/edge | 27 | 47 | 62 | 80 | 97 | 63 | 27 | |
Bowing | 10 | 14 | 13 | 11 | 13 | 12 | 2 | ||
Bottom curvature | -24 | -18 | 10 | 5 | 5 | -4 | 15 | ||