Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300: Difference between revisions
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**[[/IBE Ti etch|Ti etch with zep 520A as masking material]] | **[[/IBE Ti etch|Ti etch with zep 520A as masking material]] | ||
**Au etch with Ti as masking material | **Au etch with Ti as masking material | ||
*[[/IBE magnetic stack etch|Magnetic stack containing Ta/MnIr/NiFe | *[[/IBE magnetic stack etch|Magnetic stack containing Ta/MnIr/NiFe]] | ||
*Etch in Stainless steel with X as masking material | *Etch in Stainless steel with X as masking material | ||
*Process develop | *Process develop |
Revision as of 09:06, 10 December 2012
IBE/IBSD Ionfab 300: milling, dry etching and deposition in the same tool
IBE: Ion Beam Etch
IBSD: Ion Beam Sputter Deposition
This Ionfab300 from Oxford Instruments is capable of of both ion sputter etching/milling and sputter deposition. The etching/milling with Argon alone is done by pure physical sputtering of the surface. This causes redeposition on the sidewalls leaving side wall angles at typically between 70-90 degrees (often closest to 70 degrees).
Process information
Etch
- Some general process trends
- Results from the acceptance test:
- Au etch with zep520A as masking material
- Ti etch with zep 520A as masking material
- Au etch with Ti as masking material
- Magnetic stack containing Ta/MnIr/NiFe
- Etch in Stainless steel with X as masking material
- Process develop
Deposition
- Results from the acceptance test:
Purpose |
|
. |
---|---|---|
Performance | Etch rates |
Typical 1-100 nm/min depending om material and process parameters |
Anisotropy |
| |
Uniformity |
| |
Process parameters | Gas flows |
Etch source:
Deposition source:
|
Substrates | Batch size |
|
Materials allowed |
| |
Possible masking material |
|