Specific Process Knowledge/Characterization/Optical microscope: Difference between revisions
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|[[image:Zeiss Jenatech strain.jpg| | |[[image:Zeiss Jenatech strain.jpg|100x100px|thumb|left]] | ||
[[image:Zeiss Jenatech strain_1.jpg| | [[image:Zeiss Jenatech strain_1.jpg|100x100px|thumb|left]] | ||
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|[[image:Leica S8 APO.jpg| | |[[image:Leica S8 APO.jpg|100x100px|thumb|left]] | ||
|[[image:Zeiss_original_1.jpg| | |[[image:Zeiss_original_1.jpg|100x100px|thumb|left]] | ||
[[image:Zeiss_original_2.jpg| | [[image:Zeiss_original_2.jpg|100x100px|thumb|left]] | ||
|[[image:Leitz Medilux.jpg| | |[[image:Leitz Medilux.jpg|100x100px|thumb|left]] | ||
| | |[[image:Zeiss Axiotron.jpg|100x100px|thumb|left]] | ||
|[[image:Zeiss Jenatech particle measurement_2.jpg| | [[image:Zeiss Axiotron_1.jpg|100x100px|thumb|left]] | ||
[[image:Zeiss Jenatech particle measurement_1.jpg| | |[[image:Zeiss Jenatech particle measurement_2.jpg|100x100px|thumb|left]] | ||
|[[image:Noco IR microscope.jpg| | [[image:Zeiss Jenatech particle measurement_1.jpg|100x100px|thumb|left]] | ||
[[image:Noco IR microscope_1.jpg| | |[[image:Noco IR microscope.jpg|100x100px|thumb|left]] | ||
| | [[image:Noco IR microscope_1.jpg|100x100px|thumb|left]] | ||
||[[image:Nikon ME 600.jpg| | |[[image:Nikon SMZ 1000.jpg|100x100px|thumb|left]] | ||
[[image:Nikon ME 600_1.jpg| | ||[[image:Nikon ME 600.jpg|100x100px|thumb|left]] | ||
|[[image:Nikon Eclipse L200.jpg| | [[image:Nikon ME 600_1.jpg|100x100px|thumb|left]] | ||
[[image:Nikon Eclipse L200_1.jpg| | |[[image:Nikon Eclipse L200.jpg|100x100px|thumb|left]] | ||
|[[image:Nikon Eclipse L200 2.jpg| | [[image:Nikon Eclipse L200_1.jpg|100x100px|thumb|left]] | ||
[[image:Nikon Eclipse L200 2_1.jpg| | |[[image:Nikon Eclipse L200 2.jpg|100x100px|thumb|left]] | ||
[[image:Nikon Eclipse L200 2_1.jpg|100x100px|thumb|left]] | |||
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|'''Location''' | |'''Location''' | ||
Revision as of 11:27, 3 December 2012
| Zeiss Jenatech (strain) | Nikon SMZ 1500 | Leica S8 APO | Zeiss Original | Leitz Medilux | Zeiss Axiotron 2 | Zeiss Jenatech (particles measurements) | Noco IR microscope | Nikon SMZ 1000 | Nikon ME 600 | Nikon Eclipse L200 | Nikon Eclipse L200 (2) | |
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| Location | Cleanroom 15 | Cleanroom 13 | Cleanroom 4 | Cleanroom 4 | Cleanroom 4 | Cleanroom Hymite | Cleanroom 2 | Cleanroom III-V | Cleanroom III-V | Cleanroom 4 | Cleanroom 13 | Cleanroom 3 |
| Special features | Wollastron prism | Stereoscopic microscope | Stereoscopic microscope | No | No | No | No | IR to visible | Stereoscopic microscope | Wollastron prism | Motorized stage | No |
| Ocular magnification | 10x | No | No | 10x | 10x | 10x | 10x | 10x | No | 10x | 10x | 10x |
| Objective magnification | 2.5x, 5x, 10x, 20x, 50x | Zoom 100x | Zoom 80x | 5x, 10x, 20x, 50x, 100x | 2.5x, 5x, 10x, 20x, 50x | 5x, 10x, 20x, 50x | 5x, 10x, 20x, 50x, 100x | 2.5x, 5x, 20x, 50x | Zoom 100x | 5x, 10x, 20x, 50x, 100x | 2.5x, 5x, 10x, 20x, 50x, 100x | 2.5x, 5x, 10x, 20x, 50x |
| Bright field | Yes | No | No | Yes | Yes | Yes | Yes | Yes | No | Yes | Yes | Yes |
| Dark field | Yes | No | No | Yes | No | Yes | Yes | No | No | Yes | Yes | Yes |
| Polarizer | Yes | No | No | Yes | No | No | Yes | No | No | Yes | No | No |
| Episcopic light (reflected light) | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes |
| Diascopic light (transmitted light) | No | Yes | No | No | Yes | Yes | No | Yes | No | No | Yes | Yes |
| View with eye | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes | Yes |
| View on screen (camera) | Yes | No | NO | Yes | Yes | Yes | No | Yes | No | Yes | Yes | Yes |
| Measurement option | No | No | No | No | NO | Yes | No | No | No | No | Yes | Yes |