Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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-{| border="1"
+[[image:SEM-Leo.jpg|200x200px|right|thumb|The Leo SEM]]
-|+'''The Scanning Electron Microscopes at Danchip'''
+[[image:SEM-FEI-1.jpg|200x200px|right|thumb|The FEI SEM]]
-|-
+[[image:SEM-Jeol.jpg|200x200px|right|thumb|The Jeol SEM is located outside the cleanroom in the basement ]]
-| halign="left"|
-[[File:SEM-Leo.jpg|thumb|200px|The Leo SEM]]
-[[File:SEM-FEI-1.jpg|thumb|200px|right|The Zeiss SEM]]
-|-
-| valign="bottom"|
-[[File:SEM-FEI-1.jpg|thumb|200px|left|The FEI SEM]]
-[[File:SEM-Jeol.jpg|thumb|200px|right|The Jeol SEM is located outside the cleanroom in the basement]]
-|}
 == Scanning electron microscopy at Danchip==