Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions
| Line 35: | Line 35: | ||
|style="background:WhiteSmoke; color:black"|<b>SEM Jeol</b> | |style="background:WhiteSmoke; color:black"|<b>SEM Jeol</b> | ||
|- | |- | ||
!style="background:silver; color:black;" align="center"|Purpose | !style="background:silver; color:black;" align="center" width="52"|Purpose | ||
|style="background:LightGrey; color:black"|Imaging | |style="background:LightGrey; color:black"|Imaging | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||