Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions
| Line 1: | Line 1: | ||
== Scanning electron microscopy at Danchip== | == Scanning electron microscopy at Danchip== | ||
[[image:SEM-Leo.jpg|200x200px|right|thumb|The Leo SEM]] | |||
[[image:SEM-FEI-1.jpg|200x200px|right|thumb|The FEI SEM]] | [[image:SEM-FEI-1.jpg|200x200px|right|thumb|The FEI SEM]] | ||
[[image:SEM-Jeol.jpg|200x200px|right|thumb|The Jeol SEM is located outside the cleanroom in the basement ]] | [[image:SEM-Jeol.jpg|200x200px|right|thumb|The Jeol SEM is located outside the cleanroom in the basement ]] | ||