Specific Process Knowledge/Characterization/Four-Point Probe: Difference between revisions
| Line 1: | Line 1: | ||
==Four-Point Probe== | ==Four-Point Probe== | ||
The Four-Point Probe is a Veeco FPP-5000 for I/V measurement. The main purpose | The Four-Point Probe is a Veeco FPP-5000 for I/V measurement. The main purpose is to measure resistance and resistivity on a 4" silicon wafer. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer. | ||
The wafer are pushed down on the four pins so a measurement is performed. It works only for 4" wafers because a special holder is need. | The wafer are pushed down on the four pins so a measurement is performed. It works only for 4" wafers because a special holder is need. | ||