Specific Process Knowledge/Characterization/Four-Point Probe: Difference between revisions
No edit summary |
|||
| Line 2: | Line 2: | ||
The 4-Point Probe is used to make I/V measurement for resistance and resistivity measurement. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer. | The 4-Point Probe is used to make I/V measurement for resistance and resistivity measurement. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer. | ||
[[Image:4pointprobe.jpg|thumb|300x300px|Four point probe: positioned in cleanroom 4]] | |||
Revision as of 16:12, 28 November 2012
4-Point Probe
The 4-Point Probe is used to make I/V measurement for resistance and resistivity measurement. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer.
