Specific Process Knowledge/Characterization/Optical microscope: Difference between revisions
No edit summary |
No edit summary |
||
| Line 23: | Line 23: | ||
|[[image:Leitz Medilux.jpg|200x200px|thumb|left]] | |[[image:Leitz Medilux.jpg|200x200px|thumb|left]] | ||
| | | | ||
|[[image:Zeiss Jenatech particle | |[[image:Zeiss Jenatech particle measurement_2.jpg|175x175px|thumb|left]] | ||
[[image:Zeiss Jenatech particle measurement_1.jpg|175x175px|thumb|left]] | [[image:Zeiss Jenatech particle measurement_1.jpg|175x175px|thumb|left]] | ||
|[[image:Noco IR microscope.jpg|150x150px|thumb|left]] | |[[image:Noco IR microscope.jpg|150x150px|thumb|left]] | ||