Specific Process Knowledge/Thin film deposition/Deposition of Silicon Oxide: Difference between revisions
Appearance
| Line 66: | Line 66: | ||
*Incorporation of hydrogen in the film | *Incorporation of hydrogen in the film | ||
| | | | ||
| | |||
* | |||
|- | |- | ||
|Batch size | |Batch size | ||
| Line 89: | Line 91: | ||
*Quartz | *Quartz | ||
*Small amount of metal (in PECVD3) | *Small amount of metal (in PECVD3) | ||
| | |||
*Silicon | |||
**with layers of silicon oxide or silicon (oxy)nitride | |||
*Quartz | |||
*Metals | |||
| | | | ||
|- | |- | ||
|} | |} | ||