Specific Process Knowledge/Etch/Etching of Silicon Nitride: Difference between revisions
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*Isotropic etch | *Isotropic etch | ||
*Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity | *Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si<sub>3</sub>N<sub>4</sub>/Si (>100) and Si<sub>3</sub>N<sub>4</sub>/SiO2 (>20) @ 180 C. | ||
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*Isotropic etch | *Isotropic etch | ||
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|Etch rate | |Etch rate | ||
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* | *Si<sub>3</sub>N<sub>4</sub> @ 180 <sup>o</sup>C: ~84 Å/min | ||
* | *Si<sub>3</sub>N<sub>4</sub> @ 160 <sup>o</sup>C: ~60 Å/min | ||
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*PECVD nitride: ~400-1000 Å/min | *PECVD nitride: ~400-1000 Å/min |
Revision as of 16:20, 19 November 2007
Silicon nitride can be etched using either wet chemistry or dry etch equipment. Wet chemistry is mainly used to remove all the nitride on the surface (backside and frontside) of a wafer. Dry etching etches one side at a time and can be used to etch structures with several masking materials.
Comparison of wet Silicon Nitride etch and RIE etch for etching of Silicon Nitride
Wet Silicon Nitride etch | Buffered HF (BHF) | RIE | |
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General description |
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Possible masking materials: |
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Etch rate |
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Batch size |
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Size of substrate |
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Allowed materials |
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