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Specific Process Knowledge/Characterization/Profiler: Difference between revisions

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*see here the performance of the different objectives: [[image:Optical_Profiler_Table_2.jpg|27x27px|center|thumb]]
*see here the performance of the different objectives: [[image:Optical_Profiler_Table_2.jpg|27x27px|center|thumb]]
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|style="background:LightGrey; color:black"|Scan range z
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50 Å to 1 mm
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|style="background:LightGrey; color:black"|Resolution xy
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down to 0.067 µm
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|style="background:LightGrey; color:black"|Resolution z
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1Å, 10Å, 40Å or 160Å (for ranges 65kÅ, 655 kÅ, 2620 kÅ and 1mm respectively)
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|style="background:LightGrey; color:black"|Max. scan depth as a function of trench width W
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1.2(W[µm]-5µm)
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!style="background:silver; color:black" align="left"|Hardware settings
|style="background:LightGrey; color:black"|Tip radius
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*5 µm 45<sup>o</sup> cone
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!style="background:silver; color:black" align="left"|Substrates
!style="background:silver; color:black" align="left"|Substrates
|style="background:LightGrey; color:black"|Substrate size
|style="background:LightGrey; color:black"|Substrate size
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*up to 8"
*up to more than 6"
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