Specific Process Knowledge/Characterization/XPS: Difference between revisions
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XPS is a surface sensitive and non destructive technique used for elemental composition analysis. | XPS is a surface sensitive and non destructive technique used for elemental composition analysis. | ||
[[image:Si s.PDF|275x275px|right|thumb|Dektak8: positioned in cleanroom 4 - glass cage no. 3]] | |||
==A rough overview of XPS-ThermoScientific characteristics== | ==A rough overview of XPS-ThermoScientific characteristics== | ||