Jump to content

Specific Process Knowledge/Characterization/XRD/SLSII analysis: Difference between revisions

Reet (talk | contribs)
Reet (talk | contribs)
Line 5: Line 5:


=XRD data analysis in SmartLab Studio II=
=XRD data analysis in SmartLab Studio II=
SmartLab Studio II is an integrated software package, combining all the functionality previously available in SmartLab Guidiance, GlobalFit, PDXL, 3D explorer, and DataMapper. When SmartLab Studio II is installed on your personal computer, you will have access to all the data analysis tools, but not the machine control.
SmartLab Studio II is an integrated software package, which from 2020 onwards has combined the functionality previously available to Nanolab users in the programs SmartLab Guidance, GlobalFit, PDXL, 3D explorer, and DataMapper. When SmartLab Studio II is installed on your personal computer as described [http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XRD/software here], you will have access to all the data analysis tools, but not the machine control.


The licenses for the software are floating network licenses, and hence you must close the software when you are not using it. User management and data transfer can be done by connecting to the SQL server as described in [XRD/software]. If connected Data will be stored on the SQL server and be available on any computer.  
'''Licenses''' for the software are floating network licenses, and hence you must close the software when you are not using it. User management and data transfer can be done by connecting to the SQL server (the database) as described in the link above. 
 
'''Packages''' available for data treatment are listed below. Each package is generally named by the measurement type.
 
'''Help functions''' included in the program usually give a good overview of the options available when setting up fitting. You can access the relevant help sections by clicking on the small question mark in the pane you want to know more about. The exception is that due to a bug the question-mark-click-for-help function does not work in the software in the cleanroom, but it should work on your computer. If it doesn't, you can find the full help documents on the Cleanroom-drive - ask staff for details.


The different packages available for data treatment is listed below. Compared to the old software it is more intuitive, as the package is in general named by the measurement type. The help functions included in the program in general gives a good overview of the options available when setting up fitting, please use them by clicking on the small question mark in the pane you want to know more about.
==XRR==
==XRR==


Line 33: Line 36:
**Change fit method parameters and settings as needed.
**Change fit method parameters and settings as needed.
**If wanted set an instrumental function in the tab below the fit parameters window.
**If wanted set an instrumental function in the tab below the fit parameters window.
It is not easy to evaluate the accuracy of the fit. However, a Rigaku specialist has told us that the thickness if measuring just a single layer or a few layers should be accurate within 1 nm, as it is mostly based on the oscillation frequency, so relatively simple to fit.


For more information on how to use the XRR plugin, read the manual by clicking on the ? in the software or from [http://labmanager.dtu.dk/view_binary.php?fileId=4243 LabManager]  - requires login.
For more information on how to use the XRR plugin, read the manual by clicking on the ? in the software or from [http://labmanager.dtu.dk/view_binary.php?fileId=4243 LabManager]  - requires login.


==HRXRD==
==HRXRD==
The HRXRD package is used for analysis of crystalline materials. It can be used to derive information about crystallinity, strain, composition, and thickness. Meaning that HRXRD are used with rockingcurve and reciprocal space mapping data. Like the XRR plugin, the flow is to load data, generate a model of the layers, simulate initial parameters, and finally fit the to the data.
The HRXRD package is used for analysis of crystalline materials. It can be used to derive information about crystallinity, strain, composition, and thickness. Meaning that HRXRD are used with rocking curves and reciprocal space mapping data. Like the XRR plugin, the flow is to load data, generate a model of the layers, simulate initial parameters, and finally fit the to the data.


===Rocking Curve===
===Rocking Curve===
Line 65: Line 70:
**Change fit method parameters and settings as needed.
**Change fit method parameters and settings as needed.
**If wanted set an instrumental function in the tab below the fit parameters window.
**If wanted set an instrumental function in the tab below the fit parameters window.
===Reciprocal Space Mapping===
===Reciprocal Space Mapping===
For RSM data analysis use the RSM flow in the HRXDR plugin.
For RSM data analysis use the RSM flow in the HRXDR plugin.
Line 90: Line 96:


===RS viewer===
===RS viewer===
RS viewer is an utility for simulating and viewing the reciprocal space for one or more materials at a time. In the old software this was called 'Diffraction Space Simulation'. The utility is handy for finding 2θ angles, and how to position the goniometer for measuring in a skewed geometry. The RS viewer can be opened from either the XRD Measurement tab or the HRXRD tab by clicking the button on the ribbon.
The RS viewer (reciprocal space viewer) is an utility for simulating and viewing the reciprocal space for one or more materials at a time. In the old software this was called 'Diffraction Space Simulation'. The utility is handy for finding angles, and how to position the goniometer for measuring in a skewed geometry. It can be opened from either the XRD Measurement tab (only on computers connected to a measurement tool) or from the HRXRD tab by clicking the button on the top ribbon.


In the RS viewer it is possible to make a sample model consisting of substrates and a number of layers on top. Unfortunately it is not possible to change the concentrations of different atoms in a composition as it is in the HRXRD sample building. But for each layer it is possible to change sample axis, e. g. changing the substrate normal from (0 0 1) to (1 1 1). Using the RS viewer for setting up Reciprocal space mapping (RSM) is done in this way:
In the RS viewer it is possible to make a sample model consisting of substrates and a number of layers on top. Unfortunately it is not possible to change the concentrations of different atoms in a composition as it is in the HRXRD sample building. But for each layer it is possible to change sample axis, e. g. changing the substrate normal from (0 0 1) to (1 1 1). Using the RS viewer for setting up Reciprocal space mapping (RSM) is done in this way:
Line 136: Line 142:
==Powder XRD==
==Powder XRD==


For powder analysis licenses for Search/Match and Comprehensive analysis are available for SmartLab Studio II, if something more advanced, like Rietveld (WPPF), is needed please use the [http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XRD/HighScore_analysis software from HighScore] from Malvern Panalytical, which is available in the equipment room 346-904, or as a remote session for one user at a time.
For powder analysis licenses for Search/Match and Comprehensive analysis are available for SmartLab Studio II. If something more advanced like Rietveld refinement (WPPF) is needed, please use the [http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XRD/HighScore_analysis software from HighScore] from Malvern Panalytical, which is available in the equipment room 346-904, or as a remote session for one user at a time.


If only a simple analysis of the data is needed, please follow this guide to use SmartLab Studio II on you own PC. To convert data from XRD Powder to enable loading in SmartLab Studio II please look [[../dataconversion|here]].
If only a simple analysis of the data is needed, please follow the guide below to use SmartLab Studio II on you own PC. To convert data from XRD Powder to enable loading in SmartLab Studio II please look [[../dataconversion|here]].


[http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XRD/XRD_Reference_Data How to add reference spectra from the Inorganic Crystal Structure Database (ICSD)] (for DTU users and others with access to the ICSD).  
We have a separate page describing [http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XRD/XRD_Reference_Data how to look up or add reference spectra from the Inorganic Crystal Structure Database (ICSD)] (for DTU users and others with access to the ICSD).  


===Basic/Evaluation===
===Basic/Evaluation===
The use of the plugin for basic analysis is as following. The walk through is written for the RIR Quantification flow, if only Search/Match is wanted the evaluation flow has the same steps except the RIR part:
The use of the plugin for basic analysis is as following. The walk-through is written for the RIR Quantification flow; if only Search/Match is wanted the evaluation flow has the same steps except the RIR part:
*Load data:
*Load data:
** Data from XRD Powder has to be converted to .asc or .xy before load.
** Data from XRD Powder has to be converted to .asc or .xy before load.
Line 192: Line 198:


==Data Visualization==
==Data Visualization==
The data visualization plugin is mainly used to show data mapping, this could be data acquired by the xy-stage. 1D and 2D data is supported, and 1D graphs can be extracted from 2D plots. It further support, smoothing, background subtraction, and peak search for all loaded data sets in one go.
The data visualization plugin is mainly used to show data mapping. This could be data acquired with the xy-stage. 1D and 2D data are supported, and 1D graphs can be extracted from 2D plots. It further supports smoothing, background subtraction, and peak search for all loaded data sets in one go.


For more information click on ? in the software to right corner or see [http://labmanager.dtu.dk/view_binary.php?fileId=4251 LabManager] - requires login.
For more information click on ? in the software to right corner or see [http://labmanager.dtu.dk/view_binary.php?fileId=4251 LabManager] - requires login.


==Data Manager==
==Data Manager==
The data manager can be used for visualizing several datasets at once. As for the data visualization plugin, it support batch processing of data sets. Data comparison can easily be done with data manager, and generate a great overview of differences and similarities between samples. It can also be used to concatenate data from several measurements into one data set, this is useful for data from the XRD Powder.
The data manager can be used for visualizing several datasets at once. As for the data visualization plugin, it support batch processing of data sets. Data comparison can easily be done and generates a great overview of differences and similarities between samples. It can also be used to concatenate data from several measurements into one data set, which is useful for data from the XRD Powder.


For more information click on ? in the software top rigth corner of see [http://labmanager.dtu.dk/view_binary.php?fileId=4250 LabManager] - requires login.
For more information click on ? in the software top rigth corner of see [http://labmanager.dtu.dk/view_binary.php?fileId=4250 LabManager] - requires login.


==Materials Manager==
==Materials Manager==
The materials manager is used for adding crystal structures and amorphous material parameters for use in data simulation. For most users the compounds are proberly of most interest, as it is in here that you can generate materials like In(x)Ga(1-x)As. Materials not listed can be added by either importing a cif file or defining it by hand. I have found the homepage [http://materialsproject.org/#search/materials Materials Project] helpful. We recommend to download the symmetrized cif file for import. When adding materials please consider if the space group is the correct one. We would also prefer if the elastic stiffness tensor is entered into the software for all materials if available, which they often are on the Materials Project site.
The materials manager is used for adding crystal structures and amorphous material parameters for use in data simulation. For some users the compounds are of most interest, as it is in here that you can generate materials like In(x)Ga(1-x)As. Materials not listed can be added by either importing a cif file or defining it by hand. I (Kristian Hagsted) have found the homepage [http://materialsproject.org/#search/materials Materials Project] helpful; see also [http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XRD/XRD_Reference_Data this page] also linked to above on how to look up or add reference spectra from the Inorganic Crystal Structure Database (ICSD) (for DTU users and others with access to the ICSD).
 
We recommend downloading the symmetrized cif file for import. When adding materials please consider if the space group is the correct one. We would also prefer if the elastic stiffness tensor is entered into the software for all materials if available, which they often are on the Materials Project site.


For information about how to use the plugin please look in section 3.2 in the manual opened by clicking on the ? in the software to right corner or from [http://labmanager.dtu.dk/view_binary.php?fileId=4246 LabManager] - requires login.
For information about how to use the plugin please look in section 3.2 in the manual opened by clicking on the ? in the software to right corner or from [http://labmanager.dtu.dk/view_binary.php?fileId=4246 LabManager] - requires login.