Specific Process Knowledge/Lithography/EBeamLithography/HSQ Dose Test: Difference between revisions
Appearance
mNo edit summary |
No edit summary |
||
| Line 12: | Line 12: | ||
Below is overview optical images of the developed pattern: | Below is overview optical images of the developed pattern: | ||
[[File:Dose test optical.png|frameless|625x625px|dose test optical images|left]] | [[File:Dose test optical.png|frameless|625x625px|dose test optical images|left]] | ||
SEM images were recorded and analyzed from the structure shown below:<gallery> | |||
File:Design.png | |||
</gallery> | |||
The measured and designed critical dimension are plotted vs the doses below:<gallery> | |||
File:CD vs dose.png | |||
</gallery> | |||
The line width roughness (LWR) is plotted vs CD below: <gallery> | |||
File:LWR vs CD.png | |||
</gallery> | |||
. | |||
SEM images were recorded and analyzed from the structure shown below: | |||