Specific Process Knowledge/Etch/DRIE-Pegasus/processB: Difference between revisions
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! Uniformity (%) | ! Uniformity (%) | ||
| < 3.5 | | < 3.5 | ||
| | | 2.7 | ||
|- | |- | ||
! Repeatability (%) | ! Repeatability (%) | ||
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|+ '''Process B recipe''' | |+ '''Process B recipe''' | ||
|- | |- | ||
|- | |- | ||
! width="120" | | ! width="120" | Main etch (D->E) | ||
! width="120" | Etch | ! width="120" | Etch | ||
! width="120" | Dep | ! width="120" | Dep | ||
|- | |- | ||
! Gas flow (sccm) | ! Gas flow (sccm) | ||
| SF<sub>6</sub> 350 | | SF<sub>6</sub> 350 O<sub>2</sub> 35 | ||
| C<sub>4</sub>F<sub>8</sub> 200 | | C<sub>4</sub>F<sub>8</sub> 200 | ||
|- | |- | ||
! Cycle time (secs) | ! Cycle time (secs) | ||
| 7.0 | | 7.0 | ||
| 4.0 | | 4.0 | ||
|- | |- | ||
! Pressure (mtorr) | ! Pressure (mtorr) | ||
| | | 20 (1.5 s) 100 | ||
| 25 | | 25 | ||
|- | |- | ||
! Coil power (W) | ! Coil power (W) | ||
| 2800 | | 2800 | ||
| 2000 | | 2000 | ||
|- | |- | ||
! Platen power (W) | ! Platen power (W) | ||
| | | 130 (1.5) 40 | ||
| 0 | | 0 | ||
|- | |- | ||
! Cycles | ! Cycles | ||
| colspan="2" | | | colspan="2" | 55 (process time 10:05) | ||
|- | |- | ||
! Common | ! Common | ||
| colspan=" | | colspan="2" | Temperature 10 degs, HBC 10 torr, Short funnel, with baffle & 5mm spacers | ||
|} | |} |
Revision as of 10:23, 5 July 2011
Parameter | Specification | Average result |
---|---|---|
Etch rate (µm/min) | > 10 | 10.7 |
Etched depth (µm) | 100 | 107 |
Scallop size (nm) | < 800 | 685 |
Profile (degs) | 91 +/- 1 | 90.7 |
Selectivity to AZ photoresist | > 100 | 183 |
Undercut (µm) | <1.5 | 0.89 |
Uniformity (%) | < 3.5 | 2.7 |
Repeatability (%) | <4 | 0.47 |
Main etch (D->E) | Etch | Dep |
---|---|---|
Gas flow (sccm) | SF6 350 O2 35 | C4F8 200 |
Cycle time (secs) | 7.0 | 4.0 |
Pressure (mtorr) | 20 (1.5 s) 100 | 25 |
Coil power (W) | 2800 | 2000 |
Platen power (W) | 130 (1.5) 40 | 0 |
Cycles | 55 (process time 10:05) | |
Common | Temperature 10 degs, HBC 10 torr, Short funnel, with baffle & 5mm spacers |