Specific Process Knowledge/Characterization/Stress measurement: Difference between revisions
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Nanolab has the [[Specific_Process_Knowledge/Characterization/XRD/SLSII_analysis|SmartLab Studio software]] and the Malvern Panalytical HighScore software available for quantifying the stress (ask staff for details). There is a good summary of the principles of the strain calculation in the last section of the [https://labmanager.dtu.dk/view_binary.php?fileId=4247 associated help document] for the SmartLab Studio software. | Nanolab has the [[Specific_Process_Knowledge/Characterization/XRD/SLSII_analysis|SmartLab Studio software]] and the Malvern Panalytical HighScore software available for quantifying the stress (ask staff for details). There is a good summary of the principles of the strain calculation in the last section of the [https://labmanager.dtu.dk/view_binary.php?fileId=4247 associated help document] for the SmartLab Studio software. | ||
You may be able to measure the relaxed lattice directly rather than comparing to a theoretical lattice, but you would have to be able to release the film and measure it separately (if this means scraping the thin film off your sample mechanically, you could potentially measure it in the [[ | You may be able to measure the relaxed lattice directly rather than comparing to a theoretical lattice, but you would have to be able to release the film and measure it separately (if this means scraping the thin film off your sample mechanically, you could potentially measure it in the [[Specific Process Knowledge/Characterization/XRD/XRD SmartLab 9kW Rotating Anode|XRD Rot Anode]], though it may be difficult to get enough powder). | ||