Specific Process Knowledge/Characterization: Difference between revisions
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<sup>{{fn|1}}</sup> Using the cross section method | <sup>{{fn|1}}</sup> Using the cross section method<br> | ||
<sup>{{fn|2}}</sup> Using the create step method | <sup>{{fn|2}}</sup> Using the create step method<br> | ||
<sup>{{fn|3}}</sup> With known resistivity | <sup>{{fn|3}}</sup> With known resistivity<br> | ||
<sup>{{fn|4}}</sup> Composition information for crystalline materials | <sup>{{fn|4}}</sup> Composition information for crystalline materials<br> | ||
<sup>{{fn|5}}</sup> Only single layer | <sup>{{fn|5}}</sup> Only single layer<br> | ||
<sup>{{fn|6}}</sup> Good for characterization of VCSEL structures and DBR mirrors | <sup>{{fn|6}}</sup> Good for characterization of VCSEL structures and DBR mirrors<br> | ||
<sup>{{fn|7}}</sup> Only for crystalline films | <sup>{{fn|7}}</sup> Only for crystalline films<br> | ||
== Choose characterization topic == | == Choose characterization topic == | ||