LabAdviser/Process Flow/Solar cell process flow: Difference between revisions
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|Stylus profiler inspection | |Stylus profiler inspection | ||
|The step height of the SiO<sub>2</sub> in the doped and undoped areas are measured after the SiO<sub>2</sub> etch. | |The step height of the SiO<sub>2</sub> in the doped and undoped areas are measured after the SiO<sub>2</sub> etch. | ||
|[[Specific Process Knowledge/Characterization/ | |[[Specific Process Knowledge/Characterization/Topographic measurement|Stylus profilers]]. The different stylus profilers and their features are described. | ||
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