Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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!Generel description | !Generel description | ||
|Optical microscope | |Optical microscope | ||
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(Dektak XTA, Dektak 150, Dektak ST) | (Dektak XTA, Dektak 150, Dektak ST) | ||
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!Operation priciple | !Operation priciple | ||
|Light | |Light | ||
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!Sample information | !Sample information | ||
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!Vertical resolution | !Vertical resolution | ||
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!Horizontal resolution | !Horizontal resolution | ||
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!Resolution limitations | !Resolution limitations | ||
|Objectives and wavelength of light | |Objectives and wavelength of light | ||
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!Magnification | !Magnification | ||
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!XY range/field of view | !XY range/field of view | ||
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!Z range | !Z range | ||
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!Working distance | !Working distance | ||
|Few mm | |Few mm | ||
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!Sampling speed | !Sampling speed | ||
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!Sample requirements | !Sample requirements | ||
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!Batch size | !Batch size | ||
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!'''Allowed materials''' | !'''Allowed materials''' | ||
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The list of instruments for sample imaging available at Nanolab includes 6 [[Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes]] (SEM's) and an [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope]] (AFM). These instruments cover a wide range of applications. | The list of instruments for sample imaging available at Nanolab includes 6 [[Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes]] (SEM's) and an [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope]] (AFM). These instruments cover a wide range of applications. | ||
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=== The optical microscopes === | === The optical microscopes === | ||