Specific Process Knowledge/Characterization/Dektak XTA: Difference between revisions
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[[Category: Characterization|Profiler]] | [[Category: Characterization|Profiler]] | ||
=Dektak XTA Stylus Profiler= | =Dektak XTA (Stylus Profiler)= | ||
The Dektak XTA stylus profiler from Brüker is used for profiling surfaces of samples with structures in the micro- and nanometer range. The size of the structures that can be measured is limited by the tip dimensions. | The Dektak XTA stylus profiler from Brüker is used for profiling surfaces of samples with structures in the micro- and nanometer range. The size of the structures that can be measured is limited by the tip dimensions. | ||