Specific Process Knowledge/Characterization/Profiler: Difference between revisions

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 [[Category: Characterization|Profiler]]
-==Overview of the Nanolab profilers==
+DektakXTA info copied to
-All the profilers are compared on the [[Specific Process Knowledge/Characterization/Topographic measurement#Comparison_of_stylus_profilers.2C_optical_profilers_and_AFMs_at_Nanolab|topographic measurement]] page.
-The sections below describe each profiler (stylus profilers and optical profilers) in more detail.
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 https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/Dektak_XTA#Performance_and_Process_Parameters