Jump to content

Specific Process Knowledge/Characterization/Probe station: Difference between revisions

Rkch (talk | contribs)
No edit summary
Mmat (talk | contribs)
mNo edit summary
Line 1: Line 1:
'''Unless anything else is stated, everything on this page, text and pictures are made by DTU Nanolab.'''
{{cc-nanolab}}


'''All links to Kemibrug (SDS) and Labmanager Including APV and QC requires login.'''
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Probe_station click here]'''
 
<br>
==Probe station==
<br>
=Probe Station=
[[Image:probe2.jpg|thumb|300x300px|Probe station. Positioned in serviceroom CX1]]
[[Image:probe2.jpg|thumb|300x300px|Probe station. Positioned in serviceroom CX1]]
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Probe_station click here]'''


The Probe station is a - EPS150Triax - Cascade. The purpose is to measure I/V measurement, ohmic measurements etc. It has 4 individually adjustable triax connected probes, but can be fitted with additional coax connected probes. The stage can be moved in x and y to step and repeat a measurement over a large number of chips.
The Probe station is a - EPS150Triax - Cascade. The purpose is to measure I/V measurement, ohmic measurements etc. It has 4 individually adjustable triax connected probes, but can be fitted with additional coax connected probes. The stage can be moved in x and y to step and repeat a measurement over a large number of chips.