Specific Process Knowledge/Etch/Lithium niobate: Difference between revisions
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|-style="background:silver; color:black" | |-style="background:silver; color:black" | ||
! | ! | ||
! | ! | ||
! | ! | ||
![[Specific_Process_Knowledge/Etch/ICP_Metal_Etcher|ICP metal]] | ![[Specific_Process_Knowledge/Etch/ICP_Metal_Etcher|ICP metal]] | ||
![[Specific_Process_Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE (Ionfab300+)]] | ![[Specific_Process_Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE (Ionfab300+)]] | ||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
!Generel description | !Generel description | ||
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|Dry plasma etch of Ti | |Dry plasma etch of Ti | ||
|Sputtering of Ti - pure physical etch | |Sputtering of Ti - pure physical etch | ||
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!Etch rate range | !Etch rate range | ||
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* | * | ||
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* | * | ||
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*~50-200 nm/min (depending on features size and etch load and recipe settings) | *~50-200 nm/min (depending on features size and etch load and recipe settings) | ||
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!Etch profile | !Etch profile | ||
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* | * | ||
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* | * | ||
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*Anisotropic (vertical sidewalls) | *Anisotropic (vertical sidewalls) | ||
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!Substrate size | !Substrate size | ||
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* | * | ||
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* | * | ||
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*smaller pieces on a carrier wafer | *smaller pieces on a carrier wafer | ||
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!'''Allowed materials''' | !'''Allowed materials''' | ||
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*Silicon | *Silicon | ||