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Specific Process Knowledge/Lithography/Strip: Difference between revisions

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==Process chamber pressure for plasma asher 4 & 5==
==Process chamber pressure for plasma asher 4 & 5==
[[File:PA_chamber_pressure_v2.png|320px|thumb|Ashing rate as function of chamber pressure.|right]]
[[File:PA_chamber_pressure_v3.png|320px|thumb|Ashing rate as function of chamber pressure when processing a single substrate and when processing a full boat with 25 substrates.|right]]
The ashing rate is related to the chamber pressure during processing.  
The ashing rate is related to the chamber pressure during processing.  


Test using a single 100 mm wafer in the center of the process chamber shows that a chamber pressure of 1.3 mbar gives the highest ashing rate.
Testing found that 1.3 mbar gives the highest ashing rate for both processing single substrates and when processing a full boat with 25 substrates.


<b>Test parameters:</b><br>
'''Single substrate:'''<br>
Total gas flow rate: 150 sccm<br>
Test using a single 100 mm wafer in the center of the process chamber shows that 1.3 mbar gives the highest ashing rate.
Gas mix ratio: 30% nitrogen<br>
 
DSC: tested parameter<br>
Total gas flow rate: 500 sccm<br>
Gas mix ratio: 30% N2<br>
Chamber pressure: tested parameter<br>
Chamber pressure: tested parameter<br>
Power: 1000 W<br>
Power: 1000 W<br>
Processing time: 2 minutes<br>
Processing time: 2 minutes<br>
Temperature (average): 43°C
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'''Full boat:'''<br>
Test using a boat of 25 100 mm wafers in the center of the process chamber shows that 1.4 mbar gives the highest ashing rate.
Total gas flow rate: 200 sccm<br>
Gas mix ratio: 30% N2<br>
Chamber pressure: tested parameter<br>
Power: 1000 W<br>
Processing time: 5 minutes<br>
Temperature (average): 43°C
Temperature (average): 43°C
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