Specific Process Knowledge/Etch/ICP Metal Etcher: Difference between revisions
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!BCl<sub>3</sub> (sccm) | !BCl<sub>3</sub> (sccm) | ||
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|5 | |5 | ||
|5 | |5 | ||
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!HBr (sccm) | !HBr (sccm) | ||
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|15 | |15 | ||
|15 | |15 | ||
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! Coil power (W) | ! Coil power (W) | ||
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|900 F | |900 F | ||
|900 L | |900 L | ||
| | |900 F | ||
| | |900 F | ||
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!Platen power (W) | !Platen power (W) | ||
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|75 | |75 | ||
|60 | |60 | ||
| | |75 | ||
| | |75 | ||
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! Pressure (mtorr) | ! Pressure (mtorr) | ||
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|2 | |2 | ||
|10 | |10 | ||
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!Temperature (<sup>o</sup>C) | !Temperature (<sup>o</sup>C) | ||
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| 20 | | 20 | ||
| 50 | | 50 | ||
| | |50 | ||
| | |50 | ||
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! Spacers (mm) | ! Spacers (mm) | ||
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| 100 | | 100 | ||
| 100 | | 100 | ||
| | | 100 | ||
| | | 30 | ||
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! Process time (s) | ! Process time (s) | ||
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! Nominal line width | ! Nominal line width |
Revision as of 14:37, 6 April 2011
Etching of nanostructures in silicon using the ICP Metal Etcher or DRIE Pegasus
Recipe Sinano# | 3.0 | 3.1 | 3.2 | 3.3 | 3.4 | 4.0 | 3.5 | 3.6 | 3.3 | 3.7 | 3.31 | 3.31 | |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Cl2 (sccm) | 0 | 0 | 0 | 0 | 0 | 20 | 15 | 15 | 0 | 0 | 0 | 0 | |
BCl3 (sccm) | 5 | 3 | 5 | 5 | 5 | 0 | 5 | 5 | 5 | 5 | 5 | 5 | |
HBr (sccm) | 15 | 17 | 15 | 15 | 15 | 0 | 0 | 0 | 15 | 15 | 15 | 15 | |
Coil power (W) | 900 L | 900 F | 900 F | 900 F | 900 F | 900 L | 900 L | 900 F | 900 F | 900 L | 900 F | 900 F | |
Platen power (W) | 50 | 50 | 60 | 75 | 90 | 60 | 60 | 60 | 75 | 60 | 75 | 75 | |
Pressure (mtorr) | 2 | 2 | 2 | 2 | 2 | 2 | 5 | 10 | 2 | 10 | 2 | 2 | |
Temperature (oC) | 20 | 20 | 20 | 20 | 20 | 20 | 20 | 20 | 20 | 50 | 50 | 50 | |
Spacers (mm) | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 30 | |
Process time (s) | 150 | 180 | 120 | 180 | 120 | 90 | 120 | 180 | 300 | 180 | 180 | 180 | |
Nominal line width | Etched depths (nm) | ||||||||||||
30 nm | 198 | 231 | 147 | 214 | 163 | 227 | 185 | 170 | 295 | ||||
60 nm | 256 | 308 | 181 | 305 | 229 | 253 | 191 | 185 | 411 | ||||
90 nm | 259 | 335 | 195 | 342 | 255 | 251 | 222 | 253 | 566 | ||||
120 nm | 277 | 346 | 203 | 357 | 262 | 257 | 221 | 278 | 600 | ||||
150 nm | 269 | 341 | 205 | 369 | 265 | 262 | 225 | 280 | 647 | ||||
Nominal line width | Etch rates in trenches (nm/min) | ||||||||||||
30 nm | 79 | 77 | 74 | 71 | 82 | 151 | 93 | 57 | 59 | ||||
60 nm | 102 | 103 | 91 | 102 | 115 | 169 | 96 | 62 | 82 | ||||
90 nm | 104 | 112 | 98 | 114 | 128 | 167 | 111 | 84 | 113 | ||||
120 nm | 111 | 115 | 102 | 119 | 131 | 171 | 111 | 93 | 120 | ||||
150 nm | 108 | 114 | 103 | 123 | 133 | 175 | 113 | 93 | 129 | ||||
zep mask parameters | |||||||||||||
start (end) | 110 (64) | 178 (96) | 180 (110) | 180 (64) | 180 (72) | 110 (43) | 110 (34) | 180 (64) | 348 (53) | ||||
zep etch rate (nm/min) | 18 | 27 | 35 | 39 | 54 | 45 | 38 | 39 | 59 |