Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/SiO2 Etch/Cr mask: Difference between revisions
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</gallery> | </gallery> | ||
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*Coil Power [W]:600 | |||
*Platen Power [W]: 50 | |||
*Platen temperature [<sup>o</sup>C]: 20 | |||
*H2 flow [sccm]:0 | |||
*O2 flow [sccm]: 10 | |||
*C<sub>4</sub>F<sub>8</sub> flow [sccm]: 6.5 | |||
*He flow [sccm]:100 | |||
*Pressure:Fully open APC valve (<2 mTorr) | |||
*Electromagnetic coils (EM) 'outer coil' / 'inner coil':'0 A' / '0 A' | |||
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<gallery caption=" C10751: SiO2 etch with Cr mask on wafer piece on Si carrier 20 min etch, EM:0/0 H2:0sccm, C4F8:6.5sccm He:100sccm O2:10sccm, Pressure:?mTorr; platen power 50W, coil power:600W" perrow="7" widths="200px" heights="150px"> | <gallery caption=" C10751: SiO2 etch with Cr mask on wafer piece on Si carrier 20 min etch, EM:0/0 H2:0sccm, C4F8:6.5sccm He:100sccm O2:10sccm, Pressure:?mTorr; platen power 50W, coil power:600W" perrow="7" widths="200px" heights="150px"> | ||
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</gallery> | </gallery> | ||
|- | |- | ||
| | | | ||
*Coil Power [W]:300 | |||
*Platen Power [W]: 25 | |||
*Platen temperature [<sup>o</sup>C]: 20 | |||
*H2 flow [sccm]:0 | |||
*O2 flow [sccm]: 10 | |||
*C<sub>4</sub>F<sub>8</sub> flow [sccm]: 6.5 | |||
*He flow [sccm]:100 | |||
*Pressure:Fully open APC valve (<2 mTorr) | |||
*Electromagnetic coils (EM) 'outer coil' / 'inner coil':'0 A' / '0 A' | |||
| | | | ||
<gallery caption=" C10752: SiO2 etch with Cr mask on wafer piece on Si carrier 30 min etch, EM:0/0 H2:0sccm, C4F8:6.5sccm He:100sccm O2:10sccm, Pressure:?mTorr; platen power 25W, coil power:300W" perrow="6" widths="200px" heights="150px"> | <gallery caption=" C10752: SiO2 etch with Cr mask on wafer piece on Si carrier 30 min etch, EM:0/0 H2:0sccm, C4F8:6.5sccm He:100sccm O2:10sccm, Pressure:?mTorr; platen power 25W, coil power:300W" perrow="6" widths="200px" heights="150px"> | ||
| Line 487: | Line 505: | ||
</gallery> | </gallery> | ||
|- | |- | ||
| | | | ||
*Coil Power [W]:300 | |||
*Platen Power [W]: 25 | |||
*Platen temperature [<sup>o</sup>C]: 20 | |||
*H2 flow [sccm]:0 | |||
*O2 flow [sccm]: 10 | |||
*C<sub>4</sub>F<sub>8</sub> flow [sccm]: 6.5 | |||
*He flow [sccm]:100 | |||
*Pressure:Fully open APC valve (<2 mTorr) | |||
*Electromagnetic coils (EM) 'outer coil' / 'inner coil':'0 A' / '0 A' | |||
| | | | ||
<gallery caption=" C10834: SiO2 etch with Cr mask on wafer piece on Si carrier 45 min etch, EM:0/0 H2:0sccm, C4F8:6.5sccm He:100sccm O2:10sccm, Pressure:?mTorr; platen power 25W, coil power:300W" perrow="6" widths="200px" heights="150px"> | <gallery caption=" C10834: SiO2 etch with Cr mask on wafer piece on Si carrier 45 min etch, EM:0/0 H2:0sccm, C4F8:6.5sccm He:100sccm O2:10sccm, Pressure:?mTorr; platen power 25W, coil power:300W" perrow="6" widths="200px" heights="150px"> | ||
| Line 504: | Line 531: | ||
</gallery> | </gallery> | ||
|- | |- | ||
| | | | ||
*Coil Power [W]:300 | |||
*Platen Power [W]: 20 | |||
*Platen temperature [<sup>o</sup>C]: 20 | |||
*H2 flow [sccm]:0 | |||
*O2 flow [sccm]: 10 | |||
*C<sub>4</sub>F<sub>8</sub> flow [sccm]: 6.5 | |||
*He flow [sccm]:100 | |||
*Pressure:Fully open APC valve (<2 mTorr) | |||
*Electromagnetic coils (EM) 'outer coil' / 'inner coil':'0 A' / '0 A' | |||
| | | | ||
<gallery caption=" C10844: SiO2 etch with Cr mask on wafer piece on Si carrier 50 min etch, EM:0/0 H2:0sccm, C4F8:6.5sccm He:100sccm O2:10sccm, Pressure:?mTorr; platen power 20W, coil power:300W" perrow="6" widths="200px" heights="150px"> | <gallery caption=" C10844: SiO2 etch with Cr mask on wafer piece on Si carrier 50 min etch, EM:0/0 H2:0sccm, C4F8:6.5sccm He:100sccm O2:10sccm, Pressure:?mTorr; platen power 20W, coil power:300W" perrow="6" widths="200px" heights="150px"> | ||