Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/SiO2 Etch/Cr mask: Difference between revisions
Appearance
| Line 130: | Line 130: | ||
</gallery> | </gallery> | ||
|- | |- | ||
| | | | ||
*Coil Power [W]:2500 | |||
*Platen Power [W]: 200 | |||
*Platen temperature [<sup>o</sup>C]: 20 | |||
*H2 flow [sccm]:0 | |||
*C<sub>4</sub>F<sub>8</sub> flow [sccm]: 25.6 | |||
*He flow [sccm]:448.7 | |||
*Pressure:Fully open APC valve (8-9 mTorr) | |||
*Electromagnetic coils (EM) 'outer coil' / 'inner coil':'2 A' / '30 A' | |||
*PLEASE DO NOT RUN WITH THESE SETTINGS FOR MORE THAN 6 MIN | |||
| | | | ||
<gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 6 min etch, H2:0sccm" perrow="6" widths="200px" heights="150px"> | <gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 6 min etch, H2:0sccm" perrow="6" widths="200px" heights="150px"> | ||
| Line 141: | Line 150: | ||
</gallery> | </gallery> | ||
|- | |- | ||
| | | | ||
*Coil Power [W]:2500 | |||
*Platen Power [W]: 200 | |||
*Platen temperature [<sup>o</sup>C]: 20 | |||
*H2 flow [sccm]:0 | |||
*O2 flow [sccm]: 5 | |||
*C<sub>4</sub>F<sub>8</sub> flow [sccm]: 25.6 | |||
*He flow [sccm]:448.7 | |||
*Pressure:Fully open APC valve (8-9 mTorr) | |||
*Electromagnetic coils (EM) 'outer coil' / 'inner coil':'2 A' / '30 A' | |||
*PLEASE DO NOT RUN WITH THESE SETTINGS FOR MORE THAN 6 MIN | |||
| | | | ||
<gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 6 min etch, H2:0sccm, O2:5sccm" perrow="6" widths="200px" heights="150px"> | <gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 6 min etch, H2:0sccm, O2:5sccm" perrow="6" widths="200px" heights="150px"> | ||