Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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| The shape of the probe causes all features to look like an oval pointing towards the top left of the image. Low measured roughness as the tip skates across the top of the | | The shape of the probe causes all features to look like an oval pointing towards the top left of the image. Low measured roughness as the worn tip skates across the top of the triangles. | ||
| Same sample taken with a new probe. The triangular structures are pointing in different directions, as expected based on SEM image. Higher measured roughness as the sharper tip can map the trenches between the | | Same sample taken with a new probe. The triangular structures are pointing in different directions, as expected based on SEM image. Higher measured roughness as the sharper tip can map the trenches between the triangles. | ||
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