Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch: Difference between revisions
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! colspan="3" align="center"| Etch rates in zep resist (nm/min) | ! colspan="3" align="center"| Etch rates in zep resist (nm/min) | ||
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! | ! One point on wafer | ||
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Revision as of 09:52, 28 March 2011
| Recipe | nano1.0 | ||
|---|---|---|---|
| Tool | Pegasus | ||
| C4F8 (sccm) | 52 | ||
| SF6 (sccm) | 38 | ||
| O2 (sccm) | 0 | ||
| Coil power (W) | 800 (forward) | ||
| Platen power (W) | 50 | ||
| Pressure (mtorr) | 4 | ||
| Process time (s) | 120 | ||
| Nominal line width | Etched depths (nm) | ||
| 30 nm | |||
| 60 nm | |||
| 90 nm | |||
| 120 nm | |||
| 150 nm | |||
| Nominal line width | Etch rates in trenches (nm/min) | ||
| 30 nm | |||
| 60 nm | |||
| 90 nm | |||
| 120 nm | |||
| 150 nm | |||
| Etch rates in zep resist (nm/min) | |||
| One point on wafer | |||
| Images | Images | ||
The nanoetch