Specific Process Knowledge/Characterization/MicroSpectroPhotometer (Craic 20/30 PV): Difference between revisions
Appearance
| Line 268: | Line 268: | ||
===Reflectance measurements=== | ===Reflectance measurements=== | ||
<gallery caption="" widths="1000px" heights="600px" perrow="1"> | |||
image:eves_CRAIC_reflectance_Si_ssp_20231002.png|Reflectance measurement | |||
image:eves_CRAIC_reflectance_fused_silica_reference_20231002.png|Reflectance measurement | |||
image:eves_CRAIC_reflectance_TiO2_150C_2161cycles_refl_20231002.png|Reflectance measurement | |||
image:eves_CRAIC_reflectance_TiO2_350C_2174cycles_refl_20231002.png|Reflectance measurement | |||
image:eves_CRAIC_reflectance_AlN_20231002.png|Reflectance measurement | |||
image:eves_CRAIC_reflectance_Alu_TiO_5x5nm_10bilayer_on_Si_20231002.png|Reflectance measurement | |||
image:eves_CRAIC_reflectance_Alu_TiO_5x5nm_10bilayer_on_glass_20231002.png|Reflectance measurement | |||
image:eves_CRAIC_reflectance_rmal_Au_APTMS_20231002.png|Reflectance measurement | |||
image:eves_CRAIC_reflectance_Au_200nm_20231002.png|Reflectance measurement | |||
</gallery> | |||
===Transmittance measurements=== | ===Transmittance measurements=== | ||