Jump to content

Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/SiO2 Etch/Cr mask: Difference between revisions

Bghe (talk | contribs)
No edit summary
Bghe (talk | contribs)
No edit summary
Line 110: Line 110:


<gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 6 min etch, H2:0sccm, C4F8:13sccm He:215sccm O2:20sccm, Pressure:3.6mTorr; platen power 150W, coil power:1200W" perrow="7" widths="200px" heights="150px">
<gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 6 min etch, H2:0sccm, C4F8:13sccm He:215sccm O2:20sccm, Pressure:3.6mTorr; platen power 150W, coil power:1200W" perrow="7" widths="200px" heights="150px">
File:C10101_03__12.jpg
File:C10101_03__10.jpg
File:C10101_03__07.jpg
File:C10101_03__05.jpg
File:C10101_03__03.jpg
File:C10101_03__01.jpg
File:C10101_03__01.jpg
File:C10101_03__03.jpg
File:C10101_03__05.jpg
File:C10101_03__07.jpg
File:C10101_03__10.jpg
File:C10101_03__12.jpg
File:C10101_03__14.jpg
File:C10101_03__14.jpg
</gallery>
</gallery>