Jump to content

Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/SiO2 Etch/Cr mask: Difference between revisions

Bghe (talk | contribs)
No edit summary
Bghe (talk | contribs)
No edit summary
Line 41: Line 41:
|}
|}


*100 nm Cr mask etched in ICP metal with 500nm DUV neg resist and 65 nm barc.
*100 nm Cr mask etched in ICP metal with 500nm DUV neg resist (NUV 2300-0.5) and 65 nm barc.


<gallery caption="SiO2 etch with Cr mask on full wafer 6 min etch" perrow="6" widths="200px" heights="150px">
<gallery caption="SiO2 etch with Cr mask on full wafer 6 min etch" perrow="6" widths="200px" heights="150px">