Specific Process Knowledge/Characterization/MicroSpectroPhotometer (Craic 20/30 PV): Difference between revisions
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The remaining unreflected light passes through the aperture into the spectrophotometer, where an optical grating separates it into component wavelengths. These wavelengths are measured by a pixel on a Charge Coupled Device (CCD) detector. The data is stored and presented as an optical spectrum, visualized as an XY chart displaying intensity at each wavelength. | The remaining unreflected light passes through the aperture into the spectrophotometer, where an optical grating separates it into component wavelengths. These wavelengths are measured by a pixel on a Charge Coupled Device (CCD) detector. The data is stored and presented as an optical spectrum, visualized as an XY chart displaying intensity at each wavelength. | ||
Various microspectroscopy techniques are employed based on sample characteristics. For instance, opaque samples are analyzed with incident or reflectance illumination, while transparent samples are examined using transmitted light. Our microspectrophotometer can be configured to measure transmission, absorbance, reflectance | Various microspectroscopy techniques are employed based on sample characteristics. For instance, opaque samples are analyzed with incident or reflectance illumination, while transparent samples are examined using transmitted light. Our microspectrophotometer can be configured to measure transmission, absorbance, and reflectance spectra. | ||
Operation is straightforward: First, a dark scan measures system dark counts. Then, a reference material's spectrum is collected, encompassing spectral characteristics of the reference material, light sources, optics, and the CCD. Finally, the sample's spectrum is acquired, and an algorithm calculates the appropriate spectra for the specific lighting conditions (e.g., reflectance spectra for incident illumination). This algorithm is applied automatically, with the result displayed as a spectrum. | Operation is straightforward: First, a dark scan measures system dark counts. Then, a reference material's spectrum is collected, encompassing spectral characteristics of the reference material, light sources, optics, and the CCD. Finally, the sample's spectrum is acquired, and an algorithm calculates the appropriate spectra for the specific lighting conditions (e.g., reflectance spectra for incident illumination). This algorithm is applied automatically, with the result displayed as a spectrum. | ||
In summary, our CRAIC 20/30 PV microspectrophotometer empowers precise and versatile spectral measurements across a wide wavelength range, catering to a broad spectrum of research needs. | In summary, our CRAIC 20/30 PV microspectrophotometer empowers precise and versatile spectral measurements across a wide wavelength range, catering to a broad spectrum of research needs. | ||