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Specific Process Knowledge/Lithography/EBeamLithography: Difference between revisions

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Compared to UV lithography EBL is somewhat more complicated and in general a significantly longer process. Writing time (per area) is much higher and thus EBL is only adviseable for structures with Critical Dimensions (CD) below 1 µm. For CD equal to or higher than 1 µm please consider our '''[[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_02 | Maskless Aligner tools.]]'''
Compared to UV lithography EBL is somewhat more complicated and in general a significantly longer process. Writing time (per area) is much higher and thus EBL is only adviseable for structures with Critical Dimensions (CD) below 1 µm. For CD equal to or higher than 1 µm please consider our '''[[Specific_Process_Knowledge/Lithography/UVExposure#Aligner:_Maskless_02 | Maskless Aligner tools.]]'''
For more information and specific workflows on either tool, please refer to their respective pages; [[Specific_Process_Knowledge/Lithography/EBeamLithography/JEOL_JBX-9500FSZ|JEOL JBX-9500FSZ]] or [[Specific_Process_Knowledge/Lithography/EBeamLithography/eLINE|Raith eLINE Plus]].