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Specific Process Knowledge/Characterization/Topographic measurement: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, NLAB-Nlab347-labadviser-users-35231
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|3D Profiler for measuring microstructures and surface roughness. Can do wafer mapping. Located in the basement.
|3D Profiler for measuring microstructures and surface roughness. Can do wafer mapping. Located in the basement.
|AFM for measuring nanostructures and surface roughness
|AFM for measuring nanostructures and surface roughness
|Profiler for measuring microstructures. Located in Pack Lab.
|Profiler for measuring microstructures. Located in building 451, room 913.
|Profiler for measuring microstructures. Located in the basement.
|Profiler for measuring microstructures. Located in the basement.
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|-
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