LabAdviser/314/Microscopy 314-307/SEM/QFEG: Difference between revisions
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= Examples of the QFEG's capabilities = | = Examples of the QFEG's capabilities = | ||
''All images are taken by Marie Karen Tracy Hong Lin @DTU Nanolab'' | |||
== SEM (Scanning Electron Microscopy) == | == SEM (Scanning Electron Microscopy) == | ||
The SEM is a remarkable technique which can offer information such as the surface morphology of a sample and also a 3D appearance of the specimen. It can offer the best resolution (2 nm at 30kV) at high magnification and also topographical details because of its great depth of field. | The SEM is a remarkable technique which can offer information such as the surface morphology of a sample and also a 3D appearance of the specimen. It can offer the best resolution (2 nm at 30kV) at high magnification and also topographical details because of its great depth of field. | ||