Specific Process Knowledge/Etch/ICP Metal Etcher: Difference between revisions

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New page: ==Etching of nanostructures in silicon using the ICP Metal Etcher== === s === Two recipes have been optimized for the ASE. Their specification is on a 10 % etch load wafer with trenches...
 
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=== s ===
Two recipes have been optimized for the ASE. Their specification is on a 10 % etch load wafer with trenches.
* '''Shallolr''': The shallow etch process will etch a 2 <math>\mu</math>m opening down to make a 20 <math>\mu</math>m trench.
* '''Deepetch''': The deep etch process will etch a 50 <math>\mu</math>m opening down to make a 300 <math>\mu</math>m trench.
The standardization procedure on the ASE covers these two etches.
== Recipes on the ASE ==
=== Shallolr ===
The shallolr recipe is designed to etch features (with sizes above 1 <math>\mu</math>m) in silicon down to a depth that ranges from a few microns to some 50 microns. (If you need to etch deeper use Deepetch or more shallow, see Nanoetches.) It is specified to etch a 2 <math>\mu</math>m wide trench down to a depth of 20 <math>\mu</math>m on a wafer that has a global/local etch opening density of 10%.
The recipe is given below.


{| border="2" cellpadding="2" cellspacing="1"  
{| border="2" cellpadding="2" cellspacing="1"  
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! rowspan="6" align="center"| Main  
! rowspan="6" align="center"| Main  
| Gas
| Gas
| Cl<sub>2</sub> 20 sccm
| HBr 20 sccm
|-
|-
| Pressure
| Pressure
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|-
| Power
| Power
| 600 W CP, 200 W PP
| 900 W CP, 50 W PP
|-  
|-  
| Temperature
| Temperature
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|-
| Time
| Time
| 15 secs
| ? secs
|-
|-
|}
|}
 
ER 200 nm/min,  3:1 over resist.  Vertical profile.  To improve selectivity to oxide under-layers you can add a small amount of O2  ( e.g 2 sccm  if the MFC is small enough).   This should not give an undercut.
The process runs for 31 cycles (5:56 mins). The fact that it's Bosch process is clear from the scallops on the sidewalls - one should be able to count 31 of them.  


<gallery caption="Standardization images of the shallolr recipe" widths="300px" heights="300px" perrow="2">
<gallery caption="Standardization images of the shallolr recipe" widths="300px" heights="300px" perrow="2">

Revision as of 16:10, 23 February 2011

Etching of nanostructures in silicon using the ICP Metal Etcher

The starting point
Break Gas Cl2 20 sccm
Pressure 2 mTorr, Strike 3 secs @ 5 mTorr
Power 600 W CP, 200 W PP
Temperature 20 degs
Hardware 100 mm Spacers
Time 15 secs
Main Gas HBr 20 sccm
Pressure 2 mTorr, Strike 3 secs @ 5 mTorr
Power 900 W CP, 50 W PP
Temperature 20 degs
Hardware 100 mm Spacers
Time ? secs

ER 200 nm/min, 3:1 over resist. Vertical profile. To improve selectivity to oxide under-layers you can add a small amount of O2 ( e.g 2 sccm if the MFC is small enough). This should not give an undercut.