Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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!style="background:silver; color:black" align="left"|Hardware settings | !style="background:silver; color:black" align="left"|Hardware settings | ||
|style="background:LightGrey; color:black"|Tip radius of curvature | |style="background:LightGrey; color:black"|Tip radius of curvature | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"|Standard probe: <12 nm | ||
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!style="background:silver; color:black" align="left"|Substrates | !style="background:silver; color:black" align="left"|Substrates | ||