Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/Slow etch: Difference between revisions
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==Etch Profile SEM images== | ==Etch Profile SEM images== | ||
<gallery caption="Profile of etch for 'Slow Etch2' 12 min" widths="300px done by bghe, DTU Nanolab" heights=" | <gallery caption="Profile of etch for 'Slow Etch2' 12 min" widths="300px done by bghe, DTU Nanolab" heights="500px" perrow="3"> | ||
File:C08507_01.jpg | File:C08507_01.jpg | ||
File:C08507_02.jpg | File:C08507_02.jpg | ||
File:C08507_04.jpg | File:C08507_04.jpg | ||
</gallery> | </gallery> | ||
==Etch Uniformity maps== | ==Etch Uniformity maps== |
Revision as of 10:01, 8 March 2023
The slow etch
This work is done by Berit Herstrøm @DTU Nanolab, is nothing else is stated
The slow etch is designed to etch slow at low powers to etch thin films and to avoid overheating of samples mounted on a carrier with Capton/polyimide tape
Parameter | Recipe name: Slow Etch | Recipe name: Slow Etch2 |
---|---|---|
Coil Power [W] | 350 | 200 |
Platen Power [W] | 25 | 50 |
Platen temperature [oC] | 20 | 20 |
H2 flow [sccm] | 15 | 15 |
CF4 flow [sccm] | 30 | 30 |
Pressure [mTorr] | 3 | 10 |
Typical results | Slow Etch | Slow Etch2 |
---|---|---|
Etch of SRN | ~43nm/min [measured 39-50 nm/min over a 6" wafer] | 23-25 nm/min [4" on carrier]] |
Etch rate of Si3N4 | ~49 nm/min [4" on carrier] | 24-26 nm/min [4" on carrier] |
Etch rate of SiO2 | ~42nm/min [41-43 nm/min over a 6" wafer] | 13.7-14.7 nm/min [4" on carrier] |
Etch rate in Si | ñm/min | 11-13 nm/min (10% load, 4" wafer on 6" carrier) |
Etch rate of Mir resist | ~nm/min | ~17 nm/min |
Tested etch time without burning the resist | 3 min | 30 min |
Profile [o] |
Etch Profile SEM images
Etch Uniformity maps
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Etch rate map of SiO2 etch on 6" wafer
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Etch rate map of SRN etch on 6" wafer
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Etch rate map of Si3N4 etch on 4" wafer (on 6" carrier)
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Etch rate map of SRN etch on 4" wafer (on 6" carrier)
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Etch rate map of SiO2 etch on 4" wafer (on 6" carrier)
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Etch rate map of Si etch on 4" wafer (on 6" carrier)